Direct transfer patterning on three dimensionally deformed surfaces at micrometer resolutions and its application to hemispherical focal plane detector arrays

DOI Web Site Web Site 4 Citations

Journal

Organic Electronics

Organic Electronics 9 (6), 1122-1127, 2008-12

Elsevier BV

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Details 詳細情報について

CRID

1363670318940487552
DOI

10.1016/j.orgel.2008.07.011
ISSN

15661199
Web Site

https://api.elsevier.com/content/article/PII:S1566119908001341?httpAccept=text/xml

https://api.elsevier.com/content/article/PII:S1566119908001341?httpAccept=text/plain
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