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- F. Rubio
- Escuela de Ingenieros Industriales, San Sebastian, Spain
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- J. M. Albella
- Departamento Física Aplicada and Instituto Física Estado Sólido, CSIC, Universidad Autónoma, Madrid-34, Spain
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- J. Denis
- Departamento Física Aplicada and Instituto Física Estado Sólido, CSIC, Universidad Autónoma, Madrid-34, Spain
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- J. M. Martinez-Duart
- Departamento Física Aplicada and Instituto Física Estado Sólido, CSIC, Universidad Autónoma, Madrid-34, Spain
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説明
<jats:p>The optical properties of reactively sputtered Ta2O5 thin films are investigated in the 0.25–2.5 μm wavelength range. The dispersion curves for the refraction and absorption indices are obtained from the reflectance and transmittance spectra. From the absorption data, one electronic transition at 4.07 eV and another about 4.5 eV are obtained. Finally, the optical transitions in Ta2O5 are discussed.</jats:p>
収録刊行物
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- Journal of Vacuum Science and Technology
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Journal of Vacuum Science and Technology 21 (4), 1043-1045, 1982-11-01
American Vacuum Society
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詳細情報 詳細情報について
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- CRID
- 1364233270693493504
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- DOI
- 10.1116/1.571862
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- ISSN
- 00225355
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- データソース種別
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