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Dynamical Observation of the Thin Film Growth Processes Using Reflective High-Energy Electron Diffraction(RHEED).
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- Suzuki Yoshishige
- JRCAT-National Institute for Advenced Interdisciprinaly Reseaech
Bibliographic Information
- Other Title
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- 反射高速電子線回折（ＲＨＥＥＤ）による薄膜形成過程の観察法
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Journal
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- Materia Japan
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Materia Japan 35 (1), 53-59, 1996
The Japan Institute of Metals and Materials
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Details 詳細情報について
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- CRID
- 1390001204055986560
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- NII Article ID
- 130004119909
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- ISSN
- 18845843
- 13402625
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- Text Lang
- ja
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- Data Source
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- JaLC
- Crossref
- CiNii Articles