Phase Control of Bi2Sr2Can-1CunOy Sputtered Films using He Gas.
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- MATSUMOTO Kosuke
- Department of Electrical and Electronic Engineering, Faculty of Engineering, Tottori University
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- OGURA Mitsuru
- Department of Electrical and Electronic Engineering, Faculty of Engineering, Tottori University
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- KATSURAHARA Koji
- Department of Electrical and Electronic Engineering, Faculty of Engineering, Tottori University
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- KISHIDA Satoru
- Department of Electrical and Electronic Engineering, Faculty of Engineering, Tottori University
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- MIZUTANI Takeshi
- Advanced Materials Laboratory, NIMS
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- YOSHIKAWA Hideki
- Advanced Materials Laboratory, NIMS
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- FUKUSHIMA Sei
- Advanced Materials Laboratory, NIMS
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- TOKUTAKA Heizo
- Department of Electrical and Electronic Engineering, Faculty of Engineering, Tottori University
Bibliographic Information
- Other Title
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- Heガスを用いたBi2Sr2Can-1CunOyスパッタ薄膜の組成制御
- He ガス オ モチイタ Bi2Sr2Can 1CunOy スパッタ ハクマク ノ ソセイ セイギョ
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Abstract
We prepared Bi2Sr2Can-1CunOy (BSCCO) thin films by RF magnetron sputtering using a mixture of He + O2 sputtering gas (He : O2= 4 : 1). As helium gas effectively generates active particles of O2+ and O+ by the Penning ionization effect, the crystallinity of the films is expected to improve.<BR>The crystallinity and the composition of films were dependent on the composition of targets. When we prepared the Bi -2212 films using the targets of Bi : Sr : Ca : Cu = 2 : 2 : 1 : Z (Z = 1.0-3.0), the best crystallinity of the film was obtained using the target of Z = 2.0. Furthermore, we prepared the Bi-2223 films with the composition of target, Bi : Sr : Ca : Cu = 2 : 2 : 2 : 3. The films with dominant Bi-2223 single phase were obtained only at Tsub = 630°C, but Bi-2223 and Bi-2212 mixed phases appeared at the other substrate temperatures.
Journal
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- Shinku
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Shinku 45 (3), 297-300, 2002
The Vacuum Society of Japan
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Details 詳細情報について
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- CRID
- 1390001204065332608
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- NII Article ID
- 10008203171
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- NII Book ID
- AN00119871
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- ISSN
- 18809413
- 05598516
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- NDL BIB ID
- 6144735
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed