書誌事項
- タイトル別名
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- S1660101 Development of high-pressure/high-rotation processing machine and innovative polishing pad to achieve high efficiency and high-grade quality processing of wide-gap semiconductor material substrates
抄録
This study is intended to realize the high efficiency and high-grade quality processing of the wide gap semiconductor material substrate (SiC, GaN). We promote the research and development of the total process that fused each technique (device / system, polishing pad, slurry, etc.) into one ideally. By using a high-pressure / high-rotation processing machine and the innovative polishing pad which we developed in this study, it realized several-fold processing efficiency and large improvement of high-grade quality processing in comparison with a conventional technique.
収録刊行物
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- 年次大会
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年次大会 2014 (0), _S1660101--_S1660101-, 2014
一般社団法人 日本機械学会
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キーワード
詳細情報 詳細情報について
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- CRID
- 1390001205843808512
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- NII論文ID
- 110009945349
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- ISSN
- 24242667
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可