Development of analysis method for thermoelectric performance of CNT thin films and its application to semiconductor purity and alignment dependence

DOI
  • Kobayashi Junei
    Graduate School of Engineering, Tokyo University of Science
  • Yamamoto Takahiro
    Graduate School of Engineering, Tokyo University of Science Faculty of Science, Tokyo University of Science

Bibliographic Information

Other Title
  • CNT薄膜の熱電性能解析手法の開発及び半導体純度・配向性依存性への応用

Abstract

<p>We have developed a method for analyzing the thermoelectric performance of carbon nanotube (CNT) thin films by combining a random stick network model with electrical and thermal network analysis. Using this method, we analyzed CNT thin films with different semiconducting purities and alignments. The results not only captured the characteristics of the experimental results well but also theoretically clarified the behavior of the Seebeck coefficient in the semiconductor purity dependence and the cause of the anisotropy of the electrical conductivity and the isotropy of the Seebeck coefficient in the films with controlled alignment.</p>

Journal

Details 詳細情報について

  • CRID
    1390009018100176768
  • NII Article ID
    130008134148
  • DOI
    10.14886/jvss.2021.0_2p23s
  • ISSN
    24348589
  • Text Lang
    ja
  • Data Source
    • JaLC
    • CiNii Articles
  • Abstract License Flag
    Disallowed

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