Development of analysis method for thermoelectric performance of CNT thin films and its application to semiconductor purity and alignment dependence
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- Kobayashi Junei
- Graduate School of Engineering, Tokyo University of Science
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- Yamamoto Takahiro
- Graduate School of Engineering, Tokyo University of Science Faculty of Science, Tokyo University of Science
Bibliographic Information
- Other Title
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- CNT薄膜の熱電性能解析手法の開発及び半導体純度・配向性依存性への応用
Abstract
<p>We have developed a method for analyzing the thermoelectric performance of carbon nanotube (CNT) thin films by combining a random stick network model with electrical and thermal network analysis. Using this method, we analyzed CNT thin films with different semiconducting purities and alignments. The results not only captured the characteristics of the experimental results well but also theoretically clarified the behavior of the Seebeck coefficient in the semiconductor purity dependence and the cause of the anisotropy of the electrical conductivity and the isotropy of the Seebeck coefficient in the films with controlled alignment.</p>
Journal
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- Abstract book of Annual Meeting of the Japan Society of Vacuum and Surface Science
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Abstract book of Annual Meeting of the Japan Society of Vacuum and Surface Science 2021 (0), 2P23S-, 2021
The Japan Society of Vacuum and Surface Science
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Details 詳細情報について
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- CRID
- 1390009018100176768
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- NII Article ID
- 130008134148
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- ISSN
- 24348589
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- Text Lang
- ja
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- Data Source
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- JaLC
- CiNii Articles
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- Abstract License Flag
- Disallowed