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Development of Semiconductor Devices with Pb-Free Die-Bond Solder.
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- YOKOZAWA Masami
- Semiconductor Company, Matsushita Electronics Corp.
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- HIDAKA Koji
- Semiconductor Company, Matsushita Electronics Corp.
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- OGASHIWA Toshinori
- Production Department Technology Division, Tanaka Denshi Kogyo K, K.
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- ARIKAWA Takatoshi
- Production Department Technology Division, Tanaka Denshi Kogyo K, K.
Bibliographic Information
- Other Title
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- Pbフリーダイボンドはんだを用いた半導体デバイスの開発
- Pb フリーダイボンド ハンダ オ モチイタ ハンドウタイ デバイス ノ カイハツ
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Description
Pb-free electronic devices have been developed to remove the environmental damage from the human body. This report is related to the heat resistance and the joint reliability of diebonded section with Sn-15Sb solder. A solder bath dipping test for 10 seconds above 250°C leads to the void genelation into Sn-15Sb solder, which tends to increase the thermal resistance with a short time of thermal fatigue test. Furthermore, it should be selected the diebond solder and the back metal of die to keep the solidus temperature of die-bonded section. For the practical reflow soldering of semiconductor devices having Sn-15Sb die-bonded solder, it is essential to propose the reflow profile with the maximum peak temperature below 240°C.
Journal
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- Journal of The Japan Institute of Electronics Packaging
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Journal of The Japan Institute of Electronics Packaging 3 (7), 617-620, 2000
The Japan Institute of Electronics Packaging
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Keywords
Details 詳細情報について
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- CRID
- 1390282679538273024
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- NII Article ID
- 130004165818
- 110001238247
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- NII Book ID
- AA11231565
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- ISSN
- 1884121X
- 13439677
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- NDL BIB ID
- 5537177
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL Search
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed