書誌事項
- タイトル別名
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- Introduction of Soft X-ray Emission Spectrometer and its Applications
- ナンXセン ハッコウ ブンコウキ ノ カイハツ ト ザイリョウ ブンセキ ジレイ
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抄録
<p>A unique Soft X-ray Emission Spectrometer (SXES) has been developed. This spectrometer can analyse the emission spectrum of the soft X-ray region, based on the electron transition near the valence band, which is sensitive to the chemical bonding state of the material. Also, this spectrometer can detect X-rays in the ultra-soft X-ray region from 50 eV to 2.3 keV with parallel signal detection by using varied line spacing (VLS) gratings.</p><p>In this paper, we will introduce some typical application examples of the analysis of high temperature corrosion of Ni based alloy surface and the polymer analysis.</p>
収録刊行物
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- 表面と真空
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表面と真空 64 (11), 510-514, 2021-11-10
公益社団法人 日本表面真空学会
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詳細情報 詳細情報について
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- CRID
- 1390852956485718400
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- NII論文ID
- 130008115414
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- NII書誌ID
- AA12808657
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- ISSN
- 24335843
- 24335835
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- NDL書誌ID
- 031821676
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
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- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可