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Failure Rate Model of MIL-HDBK-217F
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- MINE Hisashi
- Kansai Electronic Industry Development Center
Bibliographic Information
- Other Title
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- MIL-HDBK-217Fの故障率モデルについて
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Description
This paper discusses mathematical expressions of temperature stress factor and electrical stress factor used in the failure rate model of MIL-HDBK-217F based on the chemical reaction speed theory, and describes failure mechanism from the viewpoint of inhomogeneous Poisson process.
Journal
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- IEICE technical report. Reliability
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IEICE technical report. Reliability 97 (370), 1-6, 1997-11-07
The Institute of Electronics, Information and Communication Engineers
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Details 詳細情報について
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- CRID
- 1573950402209968512
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- NII Article ID
- 110003301728
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- NII Book ID
- AN10013243
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- Text Lang
- ja
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- Data Source
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- CiNii Articles