Analysis of Random Telegraph Signal Noise in Dual and Single Oxide Device And Its Application to CMOS Image Sensor Readout Circuit
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- LEE Hochul
- Seoul National Univ. Dept. of EE
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- YOON Youngchang
- Seoul National Univ. Dept. of EE
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- JEON Jongwook
- Seoul National Univ. Dept. of EE
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- SHIN Hyungcheol
- Seoul National Univ. Dept. of EE
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- Extended abstracts of the ... Conference on Solid State Devices and Materials
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Extended abstracts of the ... Conference on Solid State Devices and Materials 2007 898-899, 2007-09-19
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詳細情報 詳細情報について
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- CRID
- 1574231875379530496
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- NII論文ID
- 10022551133
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- NII書誌ID
- AA10777858
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- 本文言語コード
- en
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- データソース種別
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- CiNii Articles